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Oscillator strength reduction induced by external electric fields in self-assembled quantum dots and rings

机译:自组装量子点和环中外部电场引起的振荡器强度降低

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摘要

We have carried out continuous wave and time resolved photoluminescence experiments in self-assembled In(Ga)As quantum dots and quantum rings embedded in field effect structure devices. In both kinds of nanostructures, we find a noticeable increase of the exciton radiative lifetime with the external voltage bias that must be attributed to the field-induced polarizability of the confined electron hole pair. The interplay between the exciton radiative recombination and the electronic carrier tunneling in the presence of a stationary electric field is therefore investigated and compared with a numerical calculation based on the effective mass approximation.
机译:我们已经对嵌入场效应结构器件中的自组装In(Ga)As量子点和量子环进行了连续波和时间分辨的光致发光实验。在这两种纳米结构中,我们发现激子辐射寿命随外部电压偏置而显着增加,这必须归因于受限电子空穴对的场致极化率。因此,研究了在存在固定电场的情况下激子辐射复合与电子载流子隧穿之间的相互作用,并将其与基于有效质量近似的数值计算进行了比较。

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